BH200M

BH200M reduced

Incident light microscope trinocular with sturdy well engineered frame and stage.

Dual Illumination with incident and transmitted option available on order.

Widely used in various types of semi-conductor silicon wafer inspection, materials, science study, geology mineral analysis and precision engineering and other disciplines.

WF 10x(18) eyepieces

Plan achromatic optics and Epi Kohler illumination system and anti-reflective structure in the

epi-illumination system, makes for better image clarity and contrast .

Plan achromatic 5x,10x,20x,50x,100x

4x and 5 objective position rotating nose-piece available

Mechanical stage, with 180X145mm deck platform, moving range:76mmX50mm

Reflected Kohler illumination,Adaptation wide voltage 90V-240V,6V/30W halogen bulb,brightness adjustable, with iris  diaphragm and field diaphragm, the centre of field diaphragm  adjustable

Accessories:

CTV mounts 1,0x &0.5x 0.35x

Simple Polarization equipment

B200HM brochure:BH200M Incident Light Microscope.pdf

ORDER

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